More precision
 

Geometry inspection system for silicon ingots

Ominaisuudet

• Ingot lengths up to 2500 mm
•  Virtual reconstruction of the surface
•  Can be fitted with integrated load cell
•  Automatic or manual marking of the defective places
•  Increase of the ingot yield
back to product group "Semiconductor measurement"
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Contact
FI-Jouko-Kuosmanen

Jouko Kuosmanen

+358 40 8484 109
jouko.kuosmanen@micro-epsilon.fi
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Micro-Epsilon Messtechnik
Königbacher Str. 15 94496 Ortenburg
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